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TECLAB 参展慕尼黑第19届世界无损检测大会
来源:WCNDT 2016 | 作者:AOS CHINA | 发布时间: 2017-05-12 | 2895 次浏览 | 分享到:
TECLAB 参展 第19届世界无损检测大会
          
     The WCNDT 2016 in Munich was with 2,500 participants and further 1,400 additional exhibition visitors an exceptionally well attended World Conference on Non-Destructive Testing. 273 exhibitors from all over the NDT industries exhibited on 3,400 square metres their products and methods. A committee of internationally renowned researchers had evaluated approximately 1,000 proposed papers; finally, 670 presentations in nine parallel sessions and more than 100 posters gave an overview about the latest research findings and applications in non-destructive testing.
    
     TECLAB attend this exhibition as AOS China company,and demo our advanced ultrasonic OEM products:
 


  Attendees and exhibitors from companies and research institutions expressed without exception their satisfaction. We thank all exhibitors, speakers and sponsors for their overwhelming support. Only your strong commitment made the WCNDT such a success.

The next World Conference on Non Destructive Testing will held in Seoul 2020.